http://netvouz.com/lillymark/tag/testability?feed=rss lillymark's bookmarks tagged "testability" on Netvouz http://www.computer.org/portal/web/computingnow/content?g=53319&type=article&urlTitle=new-design-for-testability-approach-for-clock-fault-testing ARTICLE: We propose a new design for testability approach for testing clock faults of next generation high performance microprocessors. In fact, it has been shown that conventional manufacturing test is unable to guarantee their detection, although they could compromise the effectiveness of delay fault testing, as well as the microprocessor correct operation in the field. lillymark Mon, 30 Dec 2013 10:46:51 GMT